By Ruijing Shen,Sheldon X.-D. Tan,Hao Yu
ISBN-10: 1461407877
ISBN-13: 9781461407874
ISBN-10: 1489987878
ISBN-13: 9781489987877
Since technique version and chip functionality uncertainties became extra reported as applied sciences minimize into the nanometer regime, actual and effective modeling or characterization of adaptations from the equipment to the structure point have develop into crucial for the profitable layout of VLSI chips.
This booklet offers readers with instruments for variation-aware layout methodologies and computer-aided layout (CAD) of VLSI platforms, within the presence of approach adaptations on the nanometer scale. It provides the most recent advancements for modeling and research, with a spotlight on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic strength research contemplating spatial correlations, statistical research and modeling for big worldwide interconnects and analog/mixed-signal circuits.
- Provides readers with well timed, systematic and finished remedies of statistical modeling and research of VLSI structures with a spotlight on interconnects, on-chip strength grids and clock networks, and analog/mixed-signal circuits;
- Helps chip designers comprehend the aptitude and boundaries in their layout instruments, bettering their layout productivity;
- Presents research of every set of rules with functional functions within the context of actual circuit design;
- Includes numerical examples for the quantitative research and overview of algorithms presented.
- Provides readers with well timed, systematic and finished remedies of statistical modeling and research of VLSI platforms with a spotlight on interconnects, on-chip energy grids and clock networks, and analog/mixed-signal circuits;
- Helps chip designers comprehend the aptitude and obstacles in their layout instruments, enhancing their layout productivity;
- Presents research of every set of rules with functional purposes within the context of actual circuit design;
- Includes numerical examples for the quantitative research and assessment of algorithms presented.
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Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs by Ruijing Shen,Sheldon X.-D. Tan,Hao Yu
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