By Nicola Nicolici,Bashir M. Al-Hashimi
ISBN-10: 140207235X
ISBN-13: 9781402072352
ISBN-10: 1441953159
ISBN-13: 9781441953155
This textual content makes a speciality of strategies for minimizing energy dissipation in the course of attempt software at common sense and register-transfer degrees of abstraction of the VLSI layout move. It surveys current options and provides a number of attempt automation ideas for decreasing energy in scan-based sequential circuits and BIST info paths.
Read or Download Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing) PDF
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Additional resources for Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing)
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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing) by Nicola Nicolici,Bashir M. Al-Hashimi
by Edward
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