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New PDF release: Power-Constrained Testing of VLSI Circuits: A Guide to the

By Nicola Nicolici,Bashir M. Al-Hashimi

ISBN-10: 140207235X

ISBN-13: 9781402072352

ISBN-10: 1441953159

ISBN-13: 9781441953155

This textual content makes a speciality of strategies for minimizing energy dissipation in the course of attempt software at common sense and register-transfer degrees of abstraction of the VLSI layout move. It surveys current options and provides a number of attempt automation ideas for decreasing energy in scan-based sequential circuits and BIST info paths.

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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing) by Nicola Nicolici,Bashir M. Al-Hashimi


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