By Angela Krstic,Kwang-Ting (Tim) Cheng
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Aiming on the center of the matter, Reuse dependent Methodologies and instruments within the layout of Analog and Mixed-Signal built-in Circuits provides a framework for the reuse-based layout of AMS circuits. The framework is based on 3 key parts: (1) a CAD-supported hierarchical layout stream that enables the incorporation of AMS reusable blocks, reduces the final layout time, and expedites the administration of accelerating AMS layout complexity; (2) a whole, transparent definition of the AMS reusable block, dependent into 3 separate aspects or perspectives: the behavioral, structural, and structure features, the 1st for top-down electric synthesis and bottom-up verification, the latter used in the course of bottom-up actual synthesis; (3) the layout for reusability set of instruments, tools, and guidance that, counting on extensive parameterization in addition to on layout wisdom seize and encapsulation, permits to supply absolutely reusable AMS blocks.
The fourth booklet of a four-part sequence, layout concept and techniques utilizing CAD/CAE integrates dialogue of contemporary engineering layout rules, complicated layout instruments, and business layout practices in the course of the layout technique. this can be the 1st ebook to combine dialogue of desktop layout instruments during the layout procedure.
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Extra info for Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing)
Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing) by Angela Krstic,Kwang-Ting (Tim) Cheng